Base Metal Analysis

Base metals such as copper, zinc, tin, lead etc. are analysed for major as well as minor elements in samples of concentrates, bullion, smelting products, recycled materials, electronic scrap and other precious/non-precious metal bearing materials. 
A variety of instrumental techniques are used, including ICP-OES, AAS and XRF.

• X-Ray Fluorescence Spectrometry (XRF) Analysis.  This technique is essentially non-destructive and allows the approximate determination of a considerable number of elements in complex matrices. Minimal sample preparation permits fast turnaround times.

• ICP-OES (Inductively Coupled Plasma Optical Emission Spectrometry)
  This method of analysis is a destructive technique and is capable of reporting elements simultaneously. The turnaround times are slightly longer than the X-Ray Fluorescence method of analysis, however the accuracy levels are far superior.